Time Series Anomaly Detection using Convolutional Neural Networks in the Manufacturing Process of RAN
2023 (English)In: Proc. - IEEE Int. Conf. Artif. Intell. Test., AITest, Institute of Electrical and Electronics Engineers Inc. , 2023, p. 90-98Conference paper, Published paper (Refereed)
Abstract [en]
The traditional approach of categorizing test results as 'Pass' or 'Fail' based on fixed thresholds can be labor-intensive and lead to dropping test data. This paper presents a framework to enhance the semi-automated software testing process by detecting deviations in executed data and alerting when anomalous inputs fall outside data-driven thresholds. In detail, the proposed solution utilizes classification with convolutional neural networks and prediction modeling using linear regression, Ridge regression, Lasso regression, and XGBoost. The study also explores transfer learning in a highly correlated use case. Empirical evaluation at a leading Telecom company validates the effectiveness of the approach, showcasing its potential to improve testing efficiency and accuracy. Despite its significance, limitations include the need for further research in different domains and industries to generalize the findings, as well as the potential biases introduced by the selected machine learning models. Overall, this study contributes to the field of semi-automated software testing and highlights the benefits of leveraging data-driven thresholds and machine learning techniques for enhanced software quality assurance processes.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2023. p. 90-98
Keywords [en]
Imbalanced Learning, Machine Learning, Moving Block Bootstrap, Software Testing, Test Optimization, Anomaly detection, Automation, Computer software selection and evaluation, Convolution, Learning systems, Logistic regression, Quality assurance, Transfer learning, Automated software testing, Convolutional neural network, Data driven, Machine-learning, Moving blocks bootstrap, Software testings, Times series, Convolutional neural networks
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:mdh:diva-64437DOI: 10.1109/AITest58265.2023.00023ISI: 001062490100014Scopus ID: 2-s2.0-85172254244ISBN: 9798350336290 (print)OAI: oai:DiVA.org:mdh-64437DiVA, id: diva2:1803348
Conference
Proceedings - 5th IEEE International Conference on Artificial Intelligence Testing, AITest 2023
2023-10-092023-10-092025-10-10Bibliographically approved