Zero-Memory-Overhead Clipping-Based Fault Tolerance for LSTM Deep Neural NetworksShow others and affiliations
2024 (English)In: Proc. IEEE Int. Symp. Defect Fault Toler. VLSI Nanotechnol. Syst., DFT, Institute of Electrical and Electronics Engineers Inc. , 2024Conference paper, Published paper (Refereed)
Abstract [en]
Long Short-Term Memory (LSTM) Deep Neural Net-works (DNNs) have shown superior accuracy in predicting and classifying time-series data. This has made them suitable for many applications, including safety-critical ones, such as healthcare, where fault tolerance is a major concern. Until now, fault resilience and mitigation in LSTMs have not been thoroughly explored, raising concerns about exploiting them in safety-critical use cases. This work, first, extensively explores the effect of faults on LSTM DNNs using fault injection into parameters. Moreover, the paper presents two effective zero-memory-overhead fault tolerance techniques for LSTM DNNs to protect them against random faults in their parameters. Experimental results indicate that the proposed techniques can improve fault tolerance of LSTM-based DNNs up to 278.6 times concerning unprotected ones.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers Inc. , 2024.
Keywords [en]
Fault Tolerance, Hardware Reliability, Healthcare, LSTMs, Neural Networks, Electronic health record, Long short-term memory, Deep neural nets, Fault resilience, LSTM, Memory overheads, Net work, Neural-networks, Short term memory, Time-series data, Deep neural networks
National Category
Computer and Information Sciences
Identifiers
URN: urn:nbn:se:mdh:diva-70680DOI: 10.1109/DFT63277.2024.10753533ISI: 001448004400013Scopus ID: 2-s2.0-85212407196ISBN: 9798350366884 (print)OAI: oai:DiVA.org:mdh-70680DiVA, id: diva2:1949000
Conference
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
2025-04-012025-04-012025-12-03Bibliographically approved