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Transforming Testing: AI as Our Testing Partner
Mälardalen University, School of Innovation, Design and Engineering, Embedded Systems. Ericsson AB, Stockholm, Sweden; Carleton Univ, Ottawa, ON, Canada.ORCID iD: 0000-0002-5070-9312
2025 (English)In: IEEE Software, ISSN 0740-7459, E-ISSN 1937-4194, Vol. 42, no 4, p. 4-7Article in journal, Editorial material (Other academic) Published
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Institute of Electrical and Electronics Engineers (IEEE) , 2025. Vol. 42, no 4, p. 4-7
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Artificial Intelligence
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URN: urn:nbn:se:mdh:diva-72160DOI: 10.1109/MS.2025.3561815ISI: 001502548100002Scopus ID: 2-s2.0-105007814754OAI: oai:DiVA.org:mdh-72160DiVA, id: diva2:1971946
Available from: 2025-06-18 Created: 2025-06-18 Last updated: 2025-11-03Bibliographically approved

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Eldh, Sigrid

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