SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN AcceleratorsShow others and affiliations
2025 (English)In: Journal of Circuits, Systems and Computers, ISSN 0218-1266, Vol. 34, no 18Article in journal (Refereed) Published
Abstract [en]
Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a well-established practical and robust method for reliability assessment, it is still a very time-consuming process. This paper addresses the time efficiency issue by introducing a novel hierarchical software-based hardware-aware fault injection strategy tailored for systolic array-based DNN accelerators. A Uniform Recurrent Equations system is used for software modeling of the systolic-array core of the DNN accelerators. The approach demonstrates a reduction of the fault injection time up to 3x compared to the state-of-the-art hybrid (software/hardware) hardware-aware fault injection frameworks and more than 2000x compared to RT-level fault injection frameworks without compromising the accuracy from the application level. Additionally, we introduce novel reliability metrics to better evaluate the robustness of a deep neural network system. The performance of the framework is studied on state-of-the-art DNN benchmarks.
Place, publisher, year, edition, pages
World Scientific Pub Co Pte Ltd , 2025. Vol. 34, no 18
Keywords [en]
Hardware accelerator, systolic array, deep neural networks, fault simulation, reliability, resilience assessment, reliability metrics
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:mdh:diva-72887DOI: 10.1142/S0218126625430017ISI: 001529505900001Scopus ID: 2-s2.0-105010959116OAI: oai:DiVA.org:mdh-72887DiVA, id: diva2:1985948
2025-07-292025-07-292025-12-03Bibliographically approved